Method for Calibrating an Analysis Device, and Associated Device

Method for Calibrating an Analysis Device, and Associated Device

A method of calibration of a device for analyzing at least one element present in a sample, said device including: a detection assembly configured to acquire an image formed by the interference between a light source and said sample; and digital processing means configured to detect a digital positi...

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Hauptverfasser: Josso, Quentin, Douet, Alice
Format: Patent
Sprache:eng
Schlagworte:
CINEMATOGRAPHY
ELECTROGRAPHY
HOLOGRAPHIC PROCESSES OR APPARATUS
HOLOGRAPHY
INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES
MEASURING
PHOTOGRAPHY
PHYSICS
TESTING
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creator Josso, Quentin
Douet, Alice
description A method of calibration of a device for analyzing at least one element present in a sample, said device including: a detection assembly configured to acquire an image formed by the interference between a light source and said sample; and digital processing means configured to detect a digital position of at least one element in said sample based on said acquired image; said calibration method including the implementation of a plurality of predetermined displacements of said sample with respect to said detection assembly and, for all of said displacements, the detection of a digital position of a same element to determine the digital position and the real position matching model according to the predetermined displacements and to the digital positions of said element after each displacement.
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subjects CINEMATOGRAPHY
ELECTROGRAPHY
HOLOGRAPHIC PROCESSES OR APPARATUS
HOLOGRAPHY
INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES
MEASURING
PHOTOGRAPHY
PHYSICS
TESTING
title Method for Calibrating an Analysis Device, and Associated Device
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