Method for Calibrating an Analysis Device, and Associated Device
A method of calibration of a device for analyzing at least one element present in a sample, said device including: a detection assembly configured to acquire an image formed by the interference between a light source and said sample; and digital processing means configured to detect a digital positi...
Gespeichert in:
Hauptverfasser: | , |
---|---|
Format: | Patent |
Sprache: | eng |
Schlagworte: | |
Online-Zugang: | Volltext bestellen |
Tags: |
Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
|
Zusammenfassung: | A method of calibration of a device for analyzing at least one element present in a sample, said device including: a detection assembly configured to acquire an image formed by the interference between a light source and said sample; and digital processing means configured to detect a digital position of at least one element in said sample based on said acquired image; said calibration method including the implementation of a plurality of predetermined displacements of said sample with respect to said detection assembly and, for all of said displacements, the detection of a digital position of a same element to determine the digital position and the real position matching model according to the predetermined displacements and to the digital positions of said element after each displacement. |
---|