MONITORING DEVICE, MONITORING SYSTEM AND MONITORING METHOD

A monitoring device includes: a distribution generating unit configured to generate an execution time distribution that is a frequency distribution of an execution time of the program; a storage unit configured to store at least one kind of abnormality information indicative of an execution time dis...

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Bibliographische Detailangaben
1. Verfasser:	NISHI, Tohru
Format:	Patent
Sprache:	eng
Schlagworte:	COMBINATIONS OR ASSOCIATIONS OF METAL-WORKING MACHINES, NOTDIRECTED TO A PARTICULAR RESULT DETAILS, COMPONENTS, OR ACCESSORIES FOR MACHINE TOOLS, e.g.ARRANGEMENTS FOR COPYING OR CONTROLLING MACHINE TOOLS MACHINE TOOLS IN GENERAL CHARACTERISED BY THE CONSTRUCTION OFPARTICULAR DETAILS OR COMPONENTS MEASURING METAL-WORKING NOT OTHERWISE PROVIDED FOR PERFORMING OPERATIONS PHYSICS TESTING TESTING STATIC OR DYNAMIC BALANCE OF MACHINES ORSTRUCTURES TESTING STRUCTURES OR APPARATUS NOT OTHERWISE PROVIDED FOR TRANSPORTING
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Beschreibung
Zusammenfassung:	A monitoring device includes: a distribution generating unit configured to generate an execution time distribution that is a frequency distribution of an execution time of the program; a storage unit configured to store at least one kind of abnormality information indicative of an execution time distribution as to an abnormality; a calculation unit configured to calculate an occurrence probability of abnormality, based on information indicating the execution time distribution generated by the distribution generating unit and the abnormality information stored in the storage unit; a threshold setting unit configured to set a probability threshold for the abnormality information; and a determination unit configured to determine that there is a sign of an abnormality when the occurrence probability is equal to or higher than the probability threshold.