MONITORING OF POLISHING PAD TEXTURE IN CHEMICAL MECHANICAL POLISHING

An apparatus for chemical mechanical polishing includes a platen having a surface to support a polishing pad, a carrier head to hold a substrate against a polishing surface of the polishing pad, a pad conditioner to press an abrasive body against the polishing surface, an in-situ polishing pad monit...

Ausführliche Beschreibung

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Bibliographische Detailangaben
Hauptverfasser: Cherian, Benjamin, Osterheld, Thomas H
Format: Patent
Sprache:eng
Schlagworte:
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