LOCALIZATION OF POTENTIAL ISSUES TO OBJECTS

LOCALIZATION OF POTENTIAL ISSUES TO OBJECTS

In some examples, a system identifies a potential issue based on comparing measurement data acquired at different hierarchical levels of a computing environment. Within a hierarchical level of the different hierarchical levels, the system determines, based on measurement data acquired for objects in...

Ausführliche Beschreibung

Gespeichert in:
Bibliographische Detailangaben
Hauptverfasser: Samalla, Aditya, Adamson, David Nellinger, Cooke, Raymond Mark
Format: Patent
Sprache:eng
Schlagworte:
CALCULATING
COMPUTING
COUNTING
ELECTRIC DIGITAL DATA PROCESSING
PHYSICS
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Beschreibung
Zusammenfassung:In some examples, a system identifies a potential issue based on comparing measurement data acquired at different hierarchical levels of a computing environment. Within a hierarchical level of the different hierarchical levels, the system determines, based on measurement data acquired for objects in the hierarchical level, whether the potential issue is localized to a subset of the objects.