ACTIVE MATRIX SUBSTRATE, AND INSPECTION DEVICE FOR THE ACTIVE MATRIX SUBSTRATE

ACTIVE MATRIX SUBSTRATE, AND INSPECTION DEVICE FOR THE ACTIVE MATRIX SUBSTRATE

An active matrix substrate includes a plurality of gate lines, a plurality of data lines, a first terminal group having a plurality of terminals connected to first ends of the plurality of gate lines, and a second terminal group having a plurality of terminals connected to first ends of the pluralit...

Ausführliche Beschreibung

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Bibliographische Detailangaben
1. Verfasser: TAKAHASHI, KOHZOH
Format: Patent
Sprache:eng
Schlagworte:
BASIC ELECTRIC ELEMENTS
ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR
ELECTRICITY
MEASURING
MEASURING ELECTRIC VARIABLES
MEASURING MAGNETIC VARIABLES
PHYSICS
SEMICONDUCTOR DEVICES
TESTING
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Beschreibung
Zusammenfassung:An active matrix substrate includes a plurality of gate lines, a plurality of data lines, a first terminal group having a plurality of terminals connected to first ends of the plurality of gate lines, and a second terminal group having a plurality of terminals connected to first ends of the plurality of data lines. The active matrix substrate further includes a plurality of inspection terminals disposed dispersedly between the plurality of terminals in the terminal group as at least one of the first terminal group and the second terminal group.