DEVICE FOR MICROSCOPIC SAMPLE COLLECTION

DEVICE FOR MICROSCOPIC SAMPLE COLLECTION

Various embodiments directed to a work stand for holding a microscopic collection device for collecting a microscopic sample from a target surface, are provided. The work stand includes a first slit formed on a top surface of the work stand and capable of holding a first microscopic collection devic...

Ausführliche Beschreibung

Gespeichert in:
Bibliographische Detailangaben
Hauptverfasser: MASTERS, David, FARRIS, Michael Heath, GEMP, Kevin Robert
Format: Patent
Sprache:eng
Schlagworte:
INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES
MEASURING
PHYSICS
TESTING
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Beschreibung
Zusammenfassung:Various embodiments directed to a work stand for holding a microscopic collection device for collecting a microscopic sample from a target surface, are provided. The work stand includes a first slit formed on a top surface of the work stand and capable of holding a first microscopic collection device comprising a first holding element and a first collection platform, wherein the first collection platform of the first microscopic collection device is perpendicular to the top surface. A second slit formed on the top surface of the work stand and capable of holding a second microscopic collection device comprising a second collection platform and a second holding element at an angle to the second collection platform perpendicular to the top surface of the work stand.