DEGRADATION SIGNALING FOR A MEMORY DEVICE

Methods, systems, and devices for degradation signaling for a memory device are described. In one example, a method in accordance with the described techniques may include monitoring, at a memory device, an operational characteristic of the memory device. For example, the threshold voltage of one or...

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Bibliographische Detailangaben
1. Verfasser: Merritt, Todd A
Format: Patent
Sprache:eng
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Zusammenfassung:Methods, systems, and devices for degradation signaling for a memory device are described. In one example, a method in accordance with the described techniques may include monitoring, at a memory device, an operational characteristic of the memory device. For example, the threshold voltage of one or more transistors within the memory device may be monitored. The memory device may identify a degradation of the memory device based at least in part on the monitored operational characteristic. Based on identifying the degradation, the memory device may signal, to a host device, an indication of the degradation of the memory device.