METHOD AND APPARATUS FOR ANALYSING PARTICULATE MATERIAL
A method and apparatus for analysing particulate material having one or more crystalline substances, the apparatus including: a grinder for receiving a sample extracted from the particulate material and grinding the sample into powdered material having a designated particle size; a measurement stati...
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Format: | Patent |
Sprache: | eng |
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Zusammenfassung: | A method and apparatus for analysing particulate material having one or more crystalline substances, the apparatus including: a grinder for receiving a sample extracted from the particulate material and grinding the sample into powdered material having a designated particle size; a measurement station including an X-ray generator for illuminating the powdered material with an X-ray beam and an X-ray detector for detecting X-ray diffraction patterns from the powdered material; a carrier for receiving the powdered material from the grinder and conveying the powdered material through the measurement station; and a processor configured to: receive the X-ray diffraction patterns of the powdered material from the X-ray detector; analyse the X-ray diffraction patterns to determine a series of sequential composition determinations of one or more crystalline substances in the powdered material as the carrier conveys the powdered material through the measurement station; and determine composition of the one or more crystalline substances in the sample from the series of sequential composition determinations. |
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