METHOD AND SYSTEM TO ACQUIRE OSCILLOMETRY MEASUREMENTS

A method for acquiring oscillometry measurements with an oscillometry measuring system comprises receiving oscillometry measurements, using at least one processor of the oscillometry measuring system, the oscillometry measurements being from at least one oscillometry recording. Parameters are identi...

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Bibliographische Detailangaben
Hauptverfasser: DRAPEAU, Guy, MAKSYM, Geoffrey N, SCHUESSLER, Thomas F
Format: Patent
Sprache:eng
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Beschreibung
Zusammenfassung:A method for acquiring oscillometry measurements with an oscillometry measuring system comprises receiving oscillometry measurements, using at least one processor of the oscillometry measuring system, the oscillometry measurements being from at least one oscillometry recording. Parameters are identified in the oscillometry measurements. An objective function(s) is calculated from the parameters of the oscillometry measurements. The objective function(s) is evaluated as a function of at least one predetermined threshold. The oscillometry measurements are accepted or rejected from the evaluating. Oscillometry data is output using the oscillometry measurements if accepted from the evaluating. A system for acquiring oscillometry measurements is also provided.