INTEGRATED CIRCUIT TEST APPARATUS

INTEGRATED CIRCUIT TEST APPARATUS

An integrated circuit test apparatus includes: a first test unit configured to output a current for a built-in self test (BIST) progress state for each internal circuit of an integrated circuit in a BIST test mode and to determine whether each internal circuit operates normally in a wake-up mode of...

Ausführliche Beschreibung

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Bibliographische Detailangaben
Hauptverfasser: PARK, Min-Ji, LIM, Ji-Hoon, LEE, Keon, WOO, Jae-Hyuck, KIM, Yeon-Ho, CHOI, Yun-Ho
Format: Patent
Sprache:eng
Schlagworte:
INFORMATION STORAGE
MEASURING
MEASURING ELECTRIC VARIABLES
MEASURING MAGNETIC VARIABLES
PHYSICS
STATIC STORES
TESTING
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Beschreibung
Zusammenfassung:An integrated circuit test apparatus includes: a first test unit configured to output a current for a built-in self test (BIST) progress state for each internal circuit of an integrated circuit in a BIST test mode and to determine whether each internal circuit operates normally in a wake-up mode of the integrated circuit; and a first determination module configured to determine whether each internal circuit is in a stuck state based on a change detected by the first test unit.