FAILURE DETECTION FOR CENTRAL ELECTRONICS COMPLEX GROUP MANAGEMENT

Examples of techniques for failure detection for central electronics complex (CEC) group management are described herein. An aspect includes issuing a first logical partition (LPAR) probe to a hardware management console (HMC) of a central electronics complex (CEC) group, wherein the CEC group comprises a plurality of LPARs. Another aspect includes receiving a first response packet from the HMC corresponding to the first LPAR probe, wherein the first response packet comprises health data corresponding to a first LPAR of the plurality of LPARs. Another aspect includes storing the health data corresponding to the first LPAR in a first health data entry corresponding to the first LPAR. Another aspect includes, for a second LPAR of the plurality of LPARs that was not included in the first response packet, updating a second health data entry corresponding to the second LPAR to indicate that the second LPAR is healthy.