LASER CHARACTERISTIC PROCESSOR

A system and process for testing and analyzing a laser beam is provided. The system and process allows for repeatable testing of a laser beam to provide a beam intensity profile while accounting for variation in measurements attributable to outside factors. The system and process further allows for...

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Bibliographische Detailangaben
Hauptverfasser:	Palie, Christopher M, Radl, Andrew J, Lee, Bryan D
Format:	Patent
Sprache:	eng
Schlagworte:	ARRANGEMENTS FOR MEASURING TWO OR MORE VARIABLES NOT COVEREDIN A SINGLE OTHER SUBCLASS INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES MEASURING MEASURING NOT SPECIALLY ADAPTED FOR A SPECIFIC VARIABLE MEASURING OR TESTING NOT OTHERWISE PROVIDED FOR PHYSICS TARIFF METERING APPARATUS TESTING
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Beschreibung
Zusammenfassung:	A system and process for testing and analyzing a laser beam is provided. The system and process allows for repeatable testing of a laser beam to provide a beam intensity profile while accounting for variation in measurements attributable to outside factors. The system and process further allows for simultaneous measurement and analysis of a laser beam having multiple wavelengths.