FULLY DEPLETED SOI TRANSISTOR WITH A BURIED FERROELECTRIC LAYER IN BACK-GATE

Provided are techniques for generating fully depleted silicon on insulator (SOI) transistor with a ferroelectric layer. The techniques include forming a first multi-layer wafer comprising a semiconductor layer and a buried oxide layer, wherein the semiconductor layer is formed over the buried oxide...

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Bibliographische Detailangaben
Hauptverfasser: Hook, Terence B, Cheng, Kangguo, Fetterolf, Shawn P
Format: Patent
Sprache:eng
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Beschreibung
Zusammenfassung:Provided are techniques for generating fully depleted silicon on insulator (SOI) transistor with a ferroelectric layer. The techniques include forming a first multi-layer wafer comprising a semiconductor layer and a buried oxide layer, wherein the semiconductor layer is formed over the buried oxide layer. The techniques also including forming a second multi-layer wafer comprising the ferroelectric layer, and bonding the first multi-layer wafer to the second multi-layer wafer, wherein the bonding comprises a coupling between the buried oxide layer and the second multi-layer wafer.