CALIBRATION OF OPEN BLOCKS IN NAND FLASH MEMORY

CALIBRATION OF OPEN BLOCKS IN NAND FLASH MEMORY

Performing a calibration of a NAND flash memory block that is in an open state. An open state of the NAND flash memory block is detected, the NAND flash memory block comprising a plurality of memory pages, each of which comprising a plurality of memory cells. A group of pages of the NAND flash memor...

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Bibliographische Detailangaben
Hauptverfasser: Papandreou, Nikolaos, Pletka, Roman A, Fisher, Timothy, Tomic, Sasa, Pozidis, Charalampos, Fry, Aaron D, Ioannou, Nikolas
Format: Patent
Sprache:eng
Schlagworte:
CALCULATING
COMPUTING
COUNTING
ELECTRIC DIGITAL DATA PROCESSING
INFORMATION STORAGE
PHYSICS
STATIC STORES
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Zusammenfassung:Performing a calibration of a NAND flash memory block that is in an open state. An open state of the NAND flash memory block is detected, the NAND flash memory block comprising a plurality of memory pages, each of which comprising a plurality of memory cells. A group of pages of the NAND flash memory block being in an open state having comparable characteristics is identified. A calibration of read voltage values to pages of the group of identified pages is performed.