PROTOCOL INDEPENDENT TESTING OF MEMORY DEVICES USING A LOOPBACK

PROTOCOL INDEPENDENT TESTING OF MEMORY DEVICES USING A LOOPBACK

A device under test for performing built-in self-tests to determine the functionality of one or more components of the device under test is described. The device under test includes a storage location to store a set of tests for testing the device under test; a data generator to generate a test patt...

Ausführliche Beschreibung

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Bibliographische Detailangaben
Hauptverfasser: Danielson, Michael B, Caraher, Patrick
Format: Patent
Sprache:eng
Schlagworte:
INFORMATION STORAGE
PHYSICS
STATIC STORES
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Beschreibung
Zusammenfassung:A device under test for performing built-in self-tests to determine the functionality of one or more components of the device under test is described. The device under test includes a storage location to store a set of tests for testing the device under test; a data generator to generate a test pattern based on a test in the set of tests; a transmission unit to transmit the test pattern to a test system; a receiver unit to receive a set of loopback signals from the test system, wherein the set of loopback signals represent the test pattern; and a data checker to determine success or failure of the device under test based on the set of loopback signals.