METHOD AND APPARATUS FOR BUILT-IN SELF-TEST

METHOD AND APPARATUS FOR BUILT-IN SELF-TEST

An apparatus comprises one or more non-clock and data recovery (CDR) components on a substrate, a signal generator on the substrate and coupled to at least one of the one or more non-CDR components, and a CDR component on the substrate and coupled to the one or more non-CDR components, wherein the C...

Ausführliche Beschreibung

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Bibliographische Detailangaben
Hauptverfasser: Ma, Jianxu, Chen, Xuefeng, Chiang, Patrick Yin, Wang, Juncheng, Bai, Rui, Lu, Ming
Format: Patent
Sprache:eng
Schlagworte:
MEASURING
MEASURING ELECTRIC VARIABLES
MEASURING MAGNETIC VARIABLES
PHYSICS
TESTING
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Beschreibung
Zusammenfassung:An apparatus comprises one or more non-clock and data recovery (CDR) components on a substrate, a signal generator on the substrate and coupled to at least one of the one or more non-CDR components, and a CDR component on the substrate and coupled to the one or more non-CDR components, wherein the CDR component is configured to recover clock data from a received signal by the CDR component, and configured to determine a signal based on the received signal and the clock data.