PROBE PIN AND INSPECTION UNIT

A probe pin is provided with a plate-like movable pin including: a flexible part configured to extend and contract lengthwise; a first contact part and a second contact part each provided at an end of the flexible part lengthwise; and a conduction-path forming element overlapping the movable pin along the thickness thereof. The conduction-path forming element includes a first contact surface and a second contact surface at lengthwise ends configured to contact the first contact part and second contact part; the movable pin and the conduction-path forming element are arranged to allow the first contact part to remain in contact with the first contact surface and the second contact part to remain in contact with the second contact surface while allowing relative movement of the movable pin and the conduction-path forming element lengthwise.