METHOD AND SYSTEM FOR DIAGNOSING MALIGNANT MELANOMA USING SCANNING PROBE MICROSCOPE

Disclosed is a method for determining malignant melanoma by a scanning probe microscope system with a cantilever, which includes: setting locations of a plurality of measurement points to be measured in a sample tissue; applying force in a predetermined range to each measurement point on the sample...

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Hauptverfasser: HUANG, Yan, CHOI, Eunjung, LEE, Wonseok, LEE, Gyudo, KIM, Byung Jun, SHIM, Jung Hee, JEON, Byoung Jun, WUFUER, Maierdanjiang, YOON, Dae Sung, CHOI, Tae Hyun, KIM, Youngmin, KIM, Jungah, HUR, Woojune, PARK, Gee Ho, JO, Seong Jin
Format: Patent
Sprache:eng
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Zusammenfassung:Disclosed is a method for determining malignant melanoma by a scanning probe microscope system with a cantilever, which includes: setting locations of a plurality of measurement points to be measured in a sample tissue; applying force in a predetermined range to each measurement point on the sample tissue through the cantilever and acquiring information on a distance between a probe and the sample tissue depending on force for each measurement point; generating a force-distance graph of measurement points based on distance information depending on the force acquired at the plurality of measurement points; and determining whether the sample tissue is malignant melanoma based on characteristics information of the sample tissue extracted from the force-distance graph.