CHARGED PARTICLE BEAM CONTROL DURING ADDITIVE LAYER MANUFACTURE

A computer-implemented method of generating scan instructions for forming a product using additive layer manufacture as a series of layers is provided. The method comprises determining a beam acceleration voltage to be used when forming the product; for each hatch area of layers of the product, dete...

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Bibliographische Detailangaben
Hauptverfasser:	Ian, LAIDLER, MCCLELLAND, Andrew, RICHARDSON, William Thomas, Phil, HOYLE
Format:	Patent
Sprache:	eng
Schlagworte:	ADDITIVE MANUFACTURING TECHNOLOGY ADDITIVE MANUFACTURING, i.e. MANUFACTURING OFTHREE-DIMENSIONAL [3-D] OBJECTS BY ADDITIVE DEPOSITION, ADDITIVEAGGLOMERATION OR ADDITIVE LAYERING, e.g. BY 3-D PRINTING,STEREOLITHOGRAPHY OR SELECTIVE LASER SINTERING CLADDING OR PLATING BY SOLDERING OR WELDING CONTROL OR REGULATING SYSTEMS IN GENERAL CONTROLLING CUTTING BY APPLYING HEAT LOCALLY, e.g. FLAME CUTTING FUNCTIONAL ELEMENTS OF SUCH SYSTEMS MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS ORELEMENTS PERFORMING OPERATIONS PHYSICS REGULATING SOLDERING OR UNSOLDERING TRANSPORTING WELDING WORKING BY LASER BEAM
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Beschreibung
Zusammenfassung:	A computer-implemented method of generating scan instructions for forming a product using additive layer manufacture as a series of layers is provided. The method comprises determining a beam acceleration voltage to be used when forming the product; for each hatch area of layers of the product, determining a respective beam current to be used when forming the hatch area and providing a respective beam current value to the hatch area description in the scan pattern instruction file; and for each line of each hatch area, determining a respective beam spot size to be used when scanning the beam along the line and providing a respective beam spot size value to the line description in the scan pattern instruction file, and determining a respective series of beam step sizes and beam step dwell times to be used when scanning the beam along the line, and providing a respective series of beam position values and beam step dwell times to the line description in the scan pattern instruction file thereby defining how the beam is to be scanned along the line. Also provided are a file of scan instructions, an additive layer manufacture apparatus, and a method of forming a product using the additive layer manufacturing apparatus.