METHOD AND APPARATUS FOR CALIBRATING CENTER FREQUENCY OF MR AND MRI SYSTEM

METHOD AND APPARATUS FOR CALIBRATING CENTER FREQUENCY OF MR AND MRI SYSTEM

Methods and apparatuses for calibrating a center frequency of MR and an MRI system are disclosed herein. An exemplary method comprises applying a first set of gradient fields, receiving data information acquired by an RF coil and generating a first image; applying a second set of gradient fields in...

Ausführliche Beschreibung

Gespeichert in:
Bibliographische Detailangaben
Hauptverfasser: Wang, Tengfei, Nie, Lisha, Wang, Tongzhou, Lai, Yongchuan
Format: Patent
Sprache:eng
Schlagworte:
MEASURING
MEASURING ELECTRIC VARIABLES
MEASURING MAGNETIC VARIABLES
PHYSICS
TESTING
Online-Zugang:Volltext bestellen
Tags: Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
container_end_page
container_issue
container_start_page
container_title
container_volume
creator Wang, Tengfei
Nie, Lisha
Wang, Tongzhou
Lai, Yongchuan
description Methods and apparatuses for calibrating a center frequency of MR and an MRI system are disclosed herein. An exemplary method comprises applying a first set of gradient fields, receiving data information acquired by an RF coil and generating a first image; applying a second set of gradient fields in directions different than those of the first set of gradient fields, receiving data information acquired by the RF coil and generating a second image; calculating a shift of the center frequency based on the first image and the second image; and correcting the center frequency based on the shift of the center frequency.
format Patent
fullrecord <record><control><sourceid>epo_EVB</sourceid><recordid>TN_cdi_epo_espacenet_US2019302212A1</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>US2019302212A1</sourcerecordid><originalsourceid>FETCH-epo_espacenet_US2019302212A13</originalsourceid><addsrcrecordid>eNrjZPDydQ3x8HdRcPQD4oAAxyDHkNBgBTf_IAVnRx9PJyDX089dwdnVL8Q1SMEtyDUw1NXPOVLB303BNwisyTfIUyE4MjjE1ZeHgTUtMac4lRdKczMou7mGOHvophbkx6cWFyQmp-allsSHBhsZGFoaGxgZGRo5GhoTpwoA894uBA</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>patent</recordtype></control><display><type>patent</type><title>METHOD AND APPARATUS FOR CALIBRATING CENTER FREQUENCY OF MR AND MRI SYSTEM</title><source>esp@cenet</source><creator>Wang, Tengfei ; Nie, Lisha ; Wang, Tongzhou ; Lai, Yongchuan</creator><creatorcontrib>Wang, Tengfei ; Nie, Lisha ; Wang, Tongzhou ; Lai, Yongchuan</creatorcontrib><description>Methods and apparatuses for calibrating a center frequency of MR and an MRI system are disclosed herein. An exemplary method comprises applying a first set of gradient fields, receiving data information acquired by an RF coil and generating a first image; applying a second set of gradient fields in directions different than those of the first set of gradient fields, receiving data information acquired by the RF coil and generating a second image; calculating a shift of the center frequency based on the first image and the second image; and correcting the center frequency based on the shift of the center frequency.</description><language>eng</language><subject>MEASURING ; MEASURING ELECTRIC VARIABLES ; MEASURING MAGNETIC VARIABLES ; PHYSICS ; TESTING</subject><creationdate>2019</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&amp;date=20191003&amp;DB=EPODOC&amp;CC=US&amp;NR=2019302212A1$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,777,882,25545,76296</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&amp;date=20191003&amp;DB=EPODOC&amp;CC=US&amp;NR=2019302212A1$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>Wang, Tengfei</creatorcontrib><creatorcontrib>Nie, Lisha</creatorcontrib><creatorcontrib>Wang, Tongzhou</creatorcontrib><creatorcontrib>Lai, Yongchuan</creatorcontrib><title>METHOD AND APPARATUS FOR CALIBRATING CENTER FREQUENCY OF MR AND MRI SYSTEM</title><description>Methods and apparatuses for calibrating a center frequency of MR and an MRI system are disclosed herein. An exemplary method comprises applying a first set of gradient fields, receiving data information acquired by an RF coil and generating a first image; applying a second set of gradient fields in directions different than those of the first set of gradient fields, receiving data information acquired by the RF coil and generating a second image; calculating a shift of the center frequency based on the first image and the second image; and correcting the center frequency based on the shift of the center frequency.</description><subject>MEASURING</subject><subject>MEASURING ELECTRIC VARIABLES</subject><subject>MEASURING MAGNETIC VARIABLES</subject><subject>PHYSICS</subject><subject>TESTING</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2019</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNrjZPDydQ3x8HdRcPQD4oAAxyDHkNBgBTf_IAVnRx9PJyDX089dwdnVL8Q1SMEtyDUw1NXPOVLB303BNwisyTfIUyE4MjjE1ZeHgTUtMac4lRdKczMou7mGOHvophbkx6cWFyQmp-allsSHBhsZGFoaGxgZGRo5GhoTpwoA894uBA</recordid><startdate>20191003</startdate><enddate>20191003</enddate><creator>Wang, Tengfei</creator><creator>Nie, Lisha</creator><creator>Wang, Tongzhou</creator><creator>Lai, Yongchuan</creator><scope>EVB</scope></search><sort><creationdate>20191003</creationdate><title>METHOD AND APPARATUS FOR CALIBRATING CENTER FREQUENCY OF MR AND MRI SYSTEM</title><author>Wang, Tengfei ; Nie, Lisha ; Wang, Tongzhou ; Lai, Yongchuan</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_US2019302212A13</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>eng</language><creationdate>2019</creationdate><topic>MEASURING</topic><topic>MEASURING ELECTRIC VARIABLES</topic><topic>MEASURING MAGNETIC VARIABLES</topic><topic>PHYSICS</topic><topic>TESTING</topic><toplevel>online_resources</toplevel><creatorcontrib>Wang, Tengfei</creatorcontrib><creatorcontrib>Nie, Lisha</creatorcontrib><creatorcontrib>Wang, Tongzhou</creatorcontrib><creatorcontrib>Lai, Yongchuan</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>Wang, Tengfei</au><au>Nie, Lisha</au><au>Wang, Tongzhou</au><au>Lai, Yongchuan</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>METHOD AND APPARATUS FOR CALIBRATING CENTER FREQUENCY OF MR AND MRI SYSTEM</title><date>2019-10-03</date><risdate>2019</risdate><abstract>Methods and apparatuses for calibrating a center frequency of MR and an MRI system are disclosed herein. An exemplary method comprises applying a first set of gradient fields, receiving data information acquired by an RF coil and generating a first image; applying a second set of gradient fields in directions different than those of the first set of gradient fields, receiving data information acquired by the RF coil and generating a second image; calculating a shift of the center frequency based on the first image and the second image; and correcting the center frequency based on the shift of the center frequency.</abstract><oa>free_for_read</oa></addata></record>
fulltext fulltext_linktorsrc
identifier
ispartof
issn
language eng
recordid cdi_epo_espacenet_US2019302212A1
source esp@cenet
subjects MEASURING
MEASURING ELECTRIC VARIABLES
MEASURING MAGNETIC VARIABLES
PHYSICS
TESTING
title METHOD AND APPARATUS FOR CALIBRATING CENTER FREQUENCY OF MR AND MRI SYSTEM
url https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-01-20T19%3A38%3A36IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-epo_EVB&rft_val_fmt=info:ofi/fmt:kev:mtx:patent&rft.genre=patent&rft.au=Wang,%20Tengfei&rft.date=2019-10-03&rft_id=info:doi/&rft_dat=%3Cepo_EVB%3EUS2019302212A1%3C/epo_EVB%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_id=info:pmid/&rfr_iscdi=true