METHOD AND APPARATUS FOR CALIBRATING CENTER FREQUENCY OF MR AND MRI SYSTEM

METHOD AND APPARATUS FOR CALIBRATING CENTER FREQUENCY OF MR AND MRI SYSTEM

Methods and apparatuses for calibrating a center frequency of MR and an MRI system are disclosed herein. An exemplary method comprises applying a first set of gradient fields, receiving data information acquired by an RF coil and generating a first image; applying a second set of gradient fields in...

Ausführliche Beschreibung

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Bibliographische Detailangaben
Hauptverfasser: Wang, Tengfei, Nie, Lisha, Wang, Tongzhou, Lai, Yongchuan
Format: Patent
Sprache:eng
Schlagworte:
MEASURING
MEASURING ELECTRIC VARIABLES
MEASURING MAGNETIC VARIABLES
PHYSICS
TESTING
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Beschreibung
Zusammenfassung:Methods and apparatuses for calibrating a center frequency of MR and an MRI system are disclosed herein. An exemplary method comprises applying a first set of gradient fields, receiving data information acquired by an RF coil and generating a first image; applying a second set of gradient fields in directions different than those of the first set of gradient fields, receiving data information acquired by the RF coil and generating a second image; calculating a shift of the center frequency based on the first image and the second image; and correcting the center frequency based on the shift of the center frequency.