Method for Forming Complementary Doped Semiconductor Regions in a Semiconductor Body

A method includes: forming first and second trenches in a semiconductor body; forming a first material layer on the semiconductor body in the first and second trenches such that a first residual trench remains in the first trench and a second residual trench remains in the second trench; removing th...

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Bibliographische Detailangaben
Hauptverfasser: Meiser, Andreas, Weber, Detlef, Gross, Thomas, Hirler, Franz, Rochel, Markus, Schloesser, Till, Weis, Rolf, Gruber, Hermann
Format: Patent
Sprache:eng
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Zusammenfassung:A method includes: forming first and second trenches in a semiconductor body; forming a first material layer on the semiconductor body in the first and second trenches such that a first residual trench remains in the first trench and a second residual trench remains in the second trench; removing the first material from the second trench; and forming a second material layer on the first material layer in the first residual trench and on the semiconductor body in the second trench. The first material layer includes dopants of a first doping type and the second material layer includes dopants of a second doping type. The method further includes diffusing dopants from the first material layer in the first trench into the semiconductor body to form a first doped region, and from the second material layer in the second trench into the semiconductor body to form a second doped region.