SYSTEM AND METHOD FOR MEASUREMENT OF MATERIAL PROPERTY USING VARIABLE REFLECTOR

A system and method for measuring a material includes at least one transmitter for transmitting a first signal and a second signal. A variable reflector reflects a portion of the first signal at a first reflecting property to produce a first reflected signal, the portion of the first signal having t...

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Bibliographische Detailangaben
Hauptverfasser: Annan, Peter, Redman, David
Format: Patent
Sprache:eng
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Beschreibung
Zusammenfassung:A system and method for measuring a material includes at least one transmitter for transmitting a first signal and a second signal. A variable reflector reflects a portion of the first signal at a first reflecting property to produce a first reflected signal, the portion of the first signal having traveled through the material. The variable reflector also reflects a portion of the second signal at a second reflecting property to produce a second reflected signal, the portion of the second signal having traveled through the material. A receiver receives the first received signal and the second received signal, the first received signal includes the first reflected signal having traveled through the material and the second received signal includes the second reflected signal having traveled through the material. The first reflected signal and the second reflected signal providing an indication of at least one property of the material. The at least one property includes permittivity, attenuation, anisotropy, and frequency dependency of the material.