GENERATING A REFLECTIVITY MODEL OF SUBSURFACE STRUCTURES

The present disclosure describes methods and systems, including computer-implemented methods, computer program products, and computer systems, for generating a reflectivity model for a subsurface area. One method includes: receiving a set of seismic data associated with the subsurface area; generati...

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Bibliographische Detailangaben
Hauptverfasser: Tsingas, Constantinos, Kim, Young Seo, Almomin, Ali Ameen, Jeong, Woodon
Format: Patent
Sprache:eng
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Beschreibung
Zusammenfassung:The present disclosure describes methods and systems, including computer-implemented methods, computer program products, and computer systems, for generating a reflectivity model for a subsurface area. One method includes: receiving a set of seismic data associated with the subsurface area; generating analytic source wavefields; generating analytic residual wavefields based on the set of seismic data and an initial reflectivity model; decomposing the analytic source wavefields and the analytic residual wavefields to obtain down-going and up-going components of the analytic source wavefields and the analytic residual wavefields; calculating a gradient vector using the down-going components of the analytic source wavefields and the up-going components of the analytic residual wavefields; calculating a source illumination factor using the down-going components of the analytic source wavefields; calculating a preconditioned gradient vector, based on the gradient vector and the source illumination factor; and generating an updated reflectivity model based on the preconditioned gradient vector.