THREE-DIMENSIONAL SCANNING DEVICE USING STRUCTURED LIGHT

A three-dimensional scanning device including: a projection unit for projecting a wide-area pattern and a local pattern on an object to be measured; an image acquisition unit for acquiring an image of the object on which the wide-area pattern and the local pattern are projected; a detection unit for...

Ausführliche Beschreibung

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Bibliographische Detailangaben
Hauptverfasser:	LEE, Seungjin, CHANG, Minho, CHANG, Jiwoong, IM, Sungbin, KIM, Hansol, LEE, Soobok, SONG, Euijeong
Format:	Patent
Sprache:	eng
Schlagworte:	CALCULATING COMPUTING COUNTING ELECTRIC COMMUNICATION TECHNIQUE ELECTRICITY IMAGE DATA PROCESSING OR GENERATION, IN GENERAL MEASURING MEASURING ANGLES MEASURING AREAS MEASURING IRREGULARITIES OF SURFACES OR CONTOURS MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS PHYSICS PICTORIAL COMMUNICATION, e.g. TELEVISION TESTING
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Beschreibung
Zusammenfassung:	A three-dimensional scanning device including: a projection unit for projecting a wide-area pattern and a local pattern on an object to be measured; an image acquisition unit for acquiring an image of the object on which the wide-area pattern and the local pattern are projected; a detection unit for detecting the locations of a plurality of first IDs that are identifiers formed in the shape that can be distinguished utilizing image information in a space within a certain range in the image of the object, on which the wide-area pattern is projected, acquired by the image acquisition unit; a collection unit for collecting data on a brightness value within a predetermined certain distance with respect to the center point of the detected first ID; and an operation unit for determining a first ID value of the first ID using information of the collection unit.