METHOD AND APPARATUS TO ACCESS HIGH VOLUME TEST DATA OVER HIGH SPEED INTERFACES

A hardware controller of a device under test (DUT) communicates with a PCIe controller to fetch test data and control test execution. The hardware controller also communicates with a JTAG/IEEE 1500 component to set up the DUT into various test configurations and to trigger test execution. For SCAN t...

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Bibliographische Detailangaben
Hauptverfasser:	Sarangi, Shantanu, Narayanun, Kaushik
Format:	Patent
Sprache:	eng
Schlagworte:	CALCULATING COMPUTING COUNTING ELECTRIC DIGITAL DATA PROCESSING IMAGE DATA PROCESSING OR GENERATION, IN GENERAL MEASURING MEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES PHYSICS TESTING
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Beschreibung
Zusammenfassung:	A hardware controller of a device under test (DUT) communicates with a PCIe controller to fetch test data and control test execution. The hardware controller also communicates with a JTAG/IEEE 1500 component to set up the DUT into various test configurations and to trigger test execution. For SCAN tests, the hardware controller provides a high throughput direct access to the on-chip compressors/decompressors to load the scan data and to collect the test results.