METHOD AND APPARATUS FOR MEASURING PROSPECTIVE SHORT CIRCUIT CURRENT
A method of determining a prospective short circuit current for an electrical system including a source includes connecting a test load between either: (i) a first phase line and a second phase line of the electrical system or (ii) the first phase line and the neutral line of the electrical system,...
Gespeichert in:
Hauptverfasser: | , |
---|---|
Format: | Patent |
Sprache: | eng |
Schlagworte: | |
Online-Zugang: | Volltext bestellen |
Tags: |
Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
|
Zusammenfassung: | A method of determining a prospective short circuit current for an electrical system including a source includes connecting a test load between either: (i) a first phase line and a second phase line of the electrical system or (ii) the first phase line and the neutral line of the electrical system, employing a sensor coupled to the electrical system to measure a voltage drop across the test load, determining a voltage value based on at least the measured voltage drop across the test load, determining a total effective impedance for the first phase line to the source, and determining the prospective short circuit current based on the voltage value and the total effective impedance. |
---|