EDGE PROFILE DETECTION

A system includes a light source, a detector, and a processor. The light source is configured to emit light onto a target. The detector is configured to receive light interaction between the emitted light and the target. The processor is configured to receive the light interaction between the emitte...

Ausführliche Beschreibung

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Bibliographische Detailangaben
Hauptverfasser:	AHNER, Joachim Walter, HAGER, Stephen Christopher Kekoa, GRODT, Travis William, LOTT, Henry Luis, TUNG, David Marcus
Format:	Patent
Sprache:	eng
Schlagworte:	CALCULATING COMPUTING COUNTING IMAGE DATA PROCESSING OR GENERATION, IN GENERAL MEASURING MEASURING ANGLES MEASURING AREAS MEASURING IRREGULARITIES OF SURFACES OR CONTOURS MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS PHYSICS TESTING
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Beschreibung
Zusammenfassung:	A system includes a light source, a detector, and a processor. The light source is configured to emit light onto a target. The detector is configured to receive light interaction between the emitted light and the target. The processor is configured to receive the light interaction between the emitted light and the target and further configured to process the light interaction to determine an edge profile associated with the target.