DEVICE FOR MEASURING AT LEAST ONE DISTANCE-RELATED PARAMETER WITH RESPECT TO AT LEAST ONE TARGET SURFACE

A device for measuring at least a distance from one or more target surfaces is provided. The device comprises at least two measuring members connected to each other so as to perform a pivotal movement about a common pivot axis passing through and perpendicular to a pivot plane of each measuring memb...

Ausführliche Beschreibung

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Bibliographische Detailangaben
Hauptverfasser:	Cohen, Oz, Biksenspaner, Yosef
Format:	Patent
Sprache:	eng
Schlagworte:	MEASURING MEASURING ANGLES MEASURING AREAS MEASURING IRREGULARITIES OF SURFACES OR CONTOURS MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS PHYSICS TESTING
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Beschreibung
Zusammenfassung:	A device for measuring at least a distance from one or more target surfaces is provided. The device comprises at least two measuring members connected to each other so as to perform a pivotal movement about a common pivot axis passing through and perpendicular to a pivot plane of each measuring member. Its longitudinal axis lies in any angular position of the measuring member with respect to the pivot axis which is disposed closer to proximal ends of the measuring members than their distal ends. The device further comprises at least one distance sensor at each of the two measuring members, positioned so that its line of sight is transverse to a reference plane perpendicular to the pivot plane and passing through the longitudinal axis. The sensor is configured for producing a signal indicative of the distance between the sensor and a target surface.