OXIDE SEMICONDUCTOR THIN FILM, MANUFACTURING METHOD FOR OXIDE SEMICONDUCTOR THIN FILM, AND THIN FILM TRANSISTOR USING OXIDE SEMICONDUCTOR THIN FILM

Provided is an oxide semiconductor thin film for which only carrier concentration has been reduced while maintaining a high carrier mobility, as well as a manufacturing method therefor. Provided is an amorphous oxide semiconductor thin film that includes indium and gallium as oxides, further include...

Ausführliche Beschreibung

Gespeichert in:
Bibliographische Detailangaben
Hauptverfasser: MATSUMURA, Fumihiko, SHIRAKI, Mana, NAKAYAMA, Tokuyuki, NISHIMURA, Eiichiro
Format: Patent
Sprache:eng
Schlagworte:
Online-Zugang:Volltext bestellen
Tags: Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
container_end_page
container_issue
container_start_page
container_title
container_volume
creator MATSUMURA, Fumihiko
SHIRAKI, Mana
NAKAYAMA, Tokuyuki
NISHIMURA, Eiichiro
description Provided is an oxide semiconductor thin film for which only carrier concentration has been reduced while maintaining a high carrier mobility, as well as a manufacturing method therefor. Provided is an amorphous oxide semiconductor thin film that includes indium and gallium as oxides, further includes hydrogen, has a gallium content such that the molecular ratio Ga/(In+Ga) is 0.15 to 0.55, and has a hydrogen content as measured by secondary ion mass spectrometry of 1.0×1020 atoms/cm3 to 1.0×1022 atoms/cm3.
format Patent
fullrecord <record><control><sourceid>epo_EVB</sourceid><recordid>TN_cdi_epo_espacenet_US2019081182A1</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>US2019081182A1</sourcerecordid><originalsourceid>FETCH-epo_espacenet_US2019081182A13</originalsourceid><addsrcrecordid>eNrjZJjsH-Hp4qoQ7Orr6ezv5xLqHOIfpBDi4emn4Obp46uj4OvoF-rm6BwSGuTp567g6xri4e-i4AZUQ0Cfo58LgqsQEuToF-wZDFITGgwyCK9uHgbWtMSc4lReKM3NoOzmGuLsoZtakB-fWlyQmJyal1oSHxpsZGBoaWBhaGhh5GhoTJwqAD2lQog</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>patent</recordtype></control><display><type>patent</type><title>OXIDE SEMICONDUCTOR THIN FILM, MANUFACTURING METHOD FOR OXIDE SEMICONDUCTOR THIN FILM, AND THIN FILM TRANSISTOR USING OXIDE SEMICONDUCTOR THIN FILM</title><source>esp@cenet</source><creator>MATSUMURA, Fumihiko ; SHIRAKI, Mana ; NAKAYAMA, Tokuyuki ; NISHIMURA, Eiichiro</creator><creatorcontrib>MATSUMURA, Fumihiko ; SHIRAKI, Mana ; NAKAYAMA, Tokuyuki ; NISHIMURA, Eiichiro</creatorcontrib><description>Provided is an oxide semiconductor thin film for which only carrier concentration has been reduced while maintaining a high carrier mobility, as well as a manufacturing method therefor. Provided is an amorphous oxide semiconductor thin film that includes indium and gallium as oxides, further includes hydrogen, has a gallium content such that the molecular ratio Ga/(In+Ga) is 0.15 to 0.55, and has a hydrogen content as measured by secondary ion mass spectrometry of 1.0×1020 atoms/cm3 to 1.0×1022 atoms/cm3.</description><language>eng</language><subject>BASIC ELECTRIC ELEMENTS ; ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR ; ELECTRICITY ; SEMICONDUCTOR DEVICES</subject><creationdate>2019</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&amp;date=20190314&amp;DB=EPODOC&amp;CC=US&amp;NR=2019081182A1$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,309,781,886,25565,76548</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&amp;date=20190314&amp;DB=EPODOC&amp;CC=US&amp;NR=2019081182A1$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>MATSUMURA, Fumihiko</creatorcontrib><creatorcontrib>SHIRAKI, Mana</creatorcontrib><creatorcontrib>NAKAYAMA, Tokuyuki</creatorcontrib><creatorcontrib>NISHIMURA, Eiichiro</creatorcontrib><title>OXIDE SEMICONDUCTOR THIN FILM, MANUFACTURING METHOD FOR OXIDE SEMICONDUCTOR THIN FILM, AND THIN FILM TRANSISTOR USING OXIDE SEMICONDUCTOR THIN FILM</title><description>Provided is an oxide semiconductor thin film for which only carrier concentration has been reduced while maintaining a high carrier mobility, as well as a manufacturing method therefor. Provided is an amorphous oxide semiconductor thin film that includes indium and gallium as oxides, further includes hydrogen, has a gallium content such that the molecular ratio Ga/(In+Ga) is 0.15 to 0.55, and has a hydrogen content as measured by secondary ion mass spectrometry of 1.0×1020 atoms/cm3 to 1.0×1022 atoms/cm3.</description><subject>BASIC ELECTRIC ELEMENTS</subject><subject>ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR</subject><subject>ELECTRICITY</subject><subject>SEMICONDUCTOR DEVICES</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2019</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNrjZJjsH-Hp4qoQ7Orr6ezv5xLqHOIfpBDi4emn4Obp46uj4OvoF-rm6BwSGuTp567g6xri4e-i4AZUQ0Cfo58LgqsQEuToF-wZDFITGgwyCK9uHgbWtMSc4lReKM3NoOzmGuLsoZtakB-fWlyQmJyal1oSHxpsZGBoaWBhaGhh5GhoTJwqAD2lQog</recordid><startdate>20190314</startdate><enddate>20190314</enddate><creator>MATSUMURA, Fumihiko</creator><creator>SHIRAKI, Mana</creator><creator>NAKAYAMA, Tokuyuki</creator><creator>NISHIMURA, Eiichiro</creator><scope>EVB</scope></search><sort><creationdate>20190314</creationdate><title>OXIDE SEMICONDUCTOR THIN FILM, MANUFACTURING METHOD FOR OXIDE SEMICONDUCTOR THIN FILM, AND THIN FILM TRANSISTOR USING OXIDE SEMICONDUCTOR THIN FILM</title><author>MATSUMURA, Fumihiko ; SHIRAKI, Mana ; NAKAYAMA, Tokuyuki ; NISHIMURA, Eiichiro</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_US2019081182A13</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>eng</language><creationdate>2019</creationdate><topic>BASIC ELECTRIC ELEMENTS</topic><topic>ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR</topic><topic>ELECTRICITY</topic><topic>SEMICONDUCTOR DEVICES</topic><toplevel>online_resources</toplevel><creatorcontrib>MATSUMURA, Fumihiko</creatorcontrib><creatorcontrib>SHIRAKI, Mana</creatorcontrib><creatorcontrib>NAKAYAMA, Tokuyuki</creatorcontrib><creatorcontrib>NISHIMURA, Eiichiro</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>MATSUMURA, Fumihiko</au><au>SHIRAKI, Mana</au><au>NAKAYAMA, Tokuyuki</au><au>NISHIMURA, Eiichiro</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>OXIDE SEMICONDUCTOR THIN FILM, MANUFACTURING METHOD FOR OXIDE SEMICONDUCTOR THIN FILM, AND THIN FILM TRANSISTOR USING OXIDE SEMICONDUCTOR THIN FILM</title><date>2019-03-14</date><risdate>2019</risdate><abstract>Provided is an oxide semiconductor thin film for which only carrier concentration has been reduced while maintaining a high carrier mobility, as well as a manufacturing method therefor. Provided is an amorphous oxide semiconductor thin film that includes indium and gallium as oxides, further includes hydrogen, has a gallium content such that the molecular ratio Ga/(In+Ga) is 0.15 to 0.55, and has a hydrogen content as measured by secondary ion mass spectrometry of 1.0×1020 atoms/cm3 to 1.0×1022 atoms/cm3.</abstract><oa>free_for_read</oa></addata></record>
fulltext fulltext_linktorsrc
identifier
ispartof
issn
language eng
recordid cdi_epo_espacenet_US2019081182A1
source esp@cenet
subjects BASIC ELECTRIC ELEMENTS
ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR
ELECTRICITY
SEMICONDUCTOR DEVICES
title OXIDE SEMICONDUCTOR THIN FILM, MANUFACTURING METHOD FOR OXIDE SEMICONDUCTOR THIN FILM, AND THIN FILM TRANSISTOR USING OXIDE SEMICONDUCTOR THIN FILM
url https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2024-12-18T13%3A33%3A27IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-epo_EVB&rft_val_fmt=info:ofi/fmt:kev:mtx:patent&rft.genre=patent&rft.au=MATSUMURA,%20Fumihiko&rft.date=2019-03-14&rft_id=info:doi/&rft_dat=%3Cepo_EVB%3EUS2019081182A1%3C/epo_EVB%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_id=info:pmid/&rfr_iscdi=true