SYSTEMS AND METHODS FOR HIGH ENERGY X-RAY DETECTION IN ELECTRON MICROSCOPES
A system for collecting information from a sample, the system includes an X-ray detector configured to mount to an electron microscope, the X-ray detector including a detection tip with a detection material positioned in the detection tip. The detection material includes a compound semiconductor mat...
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| Format: | Patent |
| Sprache: | eng |
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| Zusammenfassung: | A system for collecting information from a sample, the system includes an X-ray detector configured to mount to an electron microscope, the X-ray detector including a detection tip with a detection material positioned in the detection tip. The detection material includes a compound semiconductor material. |
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