INTEGRATED CIRCUIT DEVICE, PHYSICAL QUANTITY MEASURING DEVICE, ELECTRONIC APPARATUS, AND VEHICLE

An integrated circuit device includes a terminal region in which a second signal terminal to which a second signal is input is disposed, an AFE circuit (analog front-end circuit) that performs waveform shaping of the second signal, and a time-to-digital converter that converts a time difference betw...

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Bibliographische Detailangaben
Hauptverfasser:	TSUTSUMI, Akio, KOMATSU, Fumikazu
Format:	Patent
Sprache:	eng
Schlagworte:	ARRANGEMENTS FOR MEASURING TWO OR MORE VARIABLES NOT COVEREDIN A SINGLE OTHER SUBCLASS AUTOMATIC CONTROL, STARTING, SYNCHRONISATION, OR STABILISATIONOF GENERATORS OF ELECTRONIC OSCILLATIONS OR PULSES BASIC ELECTRONIC CIRCUITRY ELECTRICITY MEASURING MEASURING NOT SPECIALLY ADAPTED FOR A SPECIFIC VARIABLE MEASURING OR TESTING NOT OTHERWISE PROVIDED FOR PHYSICS PULSE TECHNIQUE TARIFF METERING APPARATUS TESTING
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Beschreibung
Zusammenfassung:	An integrated circuit device includes a terminal region in which a second signal terminal to which a second signal is input is disposed, an AFE circuit (analog front-end circuit) that performs waveform shaping of the second signal, and a time-to-digital converter that converts a time difference between a transition timing of a first signal and a transition timing of the second signal subjected to waveform shaping, to a digital value. When a direction from a first side of the integrated circuit device toward a second side facing the first side is set as a first direction, the AFE circuit is disposed on the first direction side of the terminal region, and the time-to-digital converter is disposed on at least one side of the first direction side of the AFE circuit and a side of a direction intersecting the first direction.