ATE COMPATIBLE HIGH-EFFICIENT FUNCTIONAL TEST

A method, computer program product and/or system is disclosed. According to an aspect of this invention, a device under test (DUT) is switched to a functional test mode. In some embodiments of the present invention, the DUT receives a general scan design (GSD) pattern while in the functional test mode. In some embodiments, the DUT executes a first functional test corresponding to the GSD pattern. In yet other embodiments, the DUT further comprises a state machine that controls the execution of the first functional test. The DUT may further store the output address, the output data, and the status to an address register, a data register, and a status register, respectively and/or send the output address, the output data, and the status to an address register to an automatic testing equipment (ATE).