SYSTEM, METHOD AND COMPUTER PROGRAM PRODUCT TO PROJECT LIGHT PATTERN

Disclosed are methods, circuits, optical assemblies, devices, systems and associated computer executable code for estimating for three dimentional imaging. According to some embodiments, there may be provided a projector operable to project a bi-dimensionally coded pattern to provide a first project...

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Bibliographische Detailangaben
1. Verfasser:	Gordon, Eyal
Format:	Patent
Sprache:	eng
Schlagworte:	ACCESSORIES THEREFOR APPARATUS OR ARRANGEMENTS EMPLOYING ANALOGOUS TECHNIQUES USINGWAVES OTHER THAN OPTICAL WAVES APPARATUS OR ARRANGEMENTS FOR TAKING PHOTOGRAPHS OR FORPROJECTING OR VIEWING THEM CALCULATING CINEMATOGRAPHY COMPUTING COUNTING ELECTRIC COMMUNICATION TECHNIQUE ELECTRICITY ELECTROGRAPHY GYROSCOPIC INSTRUMENTS HOLOGRAPHY MEASURING MEASURING ANGLES MEASURING AREAS MEASURING DISTANCES, LEVELS OR BEARINGS MEASURING IRREGULARITIES OF SURFACES OR CONTOURS MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS NAVIGATION OPTICAL ELEMENTS, SYSTEMS, OR APPARATUS OPTICS PHOTOGRAMMETRY OR VIDEOGRAMMETRY PHOTOGRAPHY PHYSICS PICTORIAL COMMUNICATION, e.g. TELEVISION SURVEYING TESTING
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Beschreibung
Zusammenfassung:	Disclosed are methods, circuits, optical assemblies, devices, systems and associated computer executable code for estimating for three dimentional imaging. According to some embodiments, there may be provided a projector operable to project a bi-dimensionally coded pattern to provide a first projection of the bi-dimensionally coded pattern and a second projection of the bi-dimensionally coded pattern. The first projection and the second projection may be offset or rigidly shifted with respect to one another, such that a first reflection off an object which is associated with the first projection and a second reflection off the object which is associated with the second projection are provided. A signal corresponding to the first reflection and a signal corresponding to the second reflection may be co-processed.