Low Temperature Process for Forming Silicon-Containing Thin Layer

The present invention relates to a method for forming a silicon-containing thin layer at a low temperature, and in particular, to a method for forming a silicon-containing thin layer by carrying out atomic layer deposition (ALD) at a low temperature.

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Hauptverfasser: Lingam, Hima Kumar, Yun, Suhyong, Choi, Yunjung, Suh, Daewoong, Yoo, Seung Ho, Park, Sun Kyung, Jeong, Heonjong
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creator Lingam, Hima Kumar
Yun, Suhyong
Choi, Yunjung
Suh, Daewoong
Yoo, Seung Ho
Park, Sun Kyung
Jeong, Heonjong
description The present invention relates to a method for forming a silicon-containing thin layer at a low temperature, and in particular, to a method for forming a silicon-containing thin layer by carrying out atomic layer deposition (ALD) at a low temperature.
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subjects BASIC ELECTRIC ELEMENTS
CHEMICAL SURFACE TREATMENT
CHEMISTRY
COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATIONOR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY IONIMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
COATING MATERIAL WITH METALLIC MATERIAL
COATING METALLIC MATERIAL
DIFFUSION TREATMENT OF METALLIC MATERIAL
ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR
ELECTRICITY
INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION INGENERAL
METALLURGY
SEMICONDUCTOR DEVICES
SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THESURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION
title Low Temperature Process for Forming Silicon-Containing Thin Layer
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