METHOD FOR FABRICATING SEMICONDUCTOR DEVICE

A method for fabricating a semiconductor device, the method including forming a mold structure on a substrate such that the mold structure includes alternately and repeatedly stacked interlayer insulating films and sacrificial films; forming a channel hole passing through the mold structure; forming...

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Bibliographische Detailangaben
Hauptverfasser: LEE, Sung Hae, KIM, Jung Ho, CHO, Yong Seok, RA, Joong Yun, KIM, Hyung Joon, KIM, Bi O, OH, Ki Yong, AHN, Jae Young
Format: Patent
Sprache:eng
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Beschreibung
Zusammenfassung:A method for fabricating a semiconductor device, the method including forming a mold structure on a substrate such that the mold structure includes alternately and repeatedly stacked interlayer insulating films and sacrificial films; forming a channel hole passing through the mold structure; forming a vertical channel structure within the channel hole; exposing a surface of the interlayer insulating films by removing the sacrificial films; forming an aluminum oxide film along a surface of the interlayer insulating films; forming a continuous film on the aluminum oxide film; and nitriding the continuous film to form a TiN film.