MACHINING DEFECT FACTOR ESTIMATION DEVICE

MACHINING DEFECT FACTOR ESTIMATION DEVICE

A machining defect factor estimation device includes a machine learning device that learns an occurrence factor of a machined-surface defect based on an inspection result on a machined surface of a workpiece. The machine learning device observes the inspection result on the machined surface of the w...

Ausführliche Beschreibung

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Bibliographische Detailangaben
Hauptverfasser: AIZAWA, Nobuaki, KAYANUMA, Tomokazu
Format: Patent
Sprache:eng
Schlagworte:
CONTROL OR REGULATING SYSTEMS IN GENERAL
CONTROLLING
FUNCTIONAL ELEMENTS OF SUCH SYSTEMS
MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS ORELEMENTS
PHYSICS
REGULATING
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Beschreibung
Zusammenfassung:A machining defect factor estimation device includes a machine learning device that learns an occurrence factor of a machined-surface defect based on an inspection result on a machined surface of a workpiece. The machine learning device observes the inspection result on the machined surface of the workpiece from an inspection device, as a state variable, acquires label data indicating the occurrence factor of the machined-surface defect, and learns the state variable and the label data in a manner such that they are correlated each other.