DETERMINING SURFACE ROUGHNESS

A measurement system (301) for determining surface roughness is shown. A coherent illumination device (303) illuminates the surface of, for example, a component (201) with coherent light. An imaging device (304) obtains an image of speckle caused by the scattering of the coherent light from the surf...

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Hauptverfasser: VADAKKE MATHAM, Murukeshan, HARIDAS, Aswin, CRIVOI, Alexandru, PATINHAREKANDY, Prabhathan
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creator VADAKKE MATHAM, Murukeshan
HARIDAS, Aswin
CRIVOI, Alexandru
PATINHAREKANDY, Prabhathan
description A measurement system (301) for determining surface roughness is shown. A coherent illumination device (303) illuminates the surface of, for example, a component (201) with coherent light. An imaging device (304) obtains an image of speckle caused by the scattering of the coherent light from the surface. A processing device (305) converts the image into a binary image according to a threshold, thereby classifying pixels below the threshold as background pixels and pixels above the threshold as foreground pixels. One or more regions of connected foreground pixels are then identified in the binary image, in which any two foreground pixels in a region are joined by a continuous path of foreground pixels. The total number of regions identified and the number of pixels in the largest region are then evaluated, each of which correlate with surface roughness. An indication of the surface roughness of the surface is then outputted.
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fullrecord <record><control><sourceid>epo_EVB</sourceid><recordid>TN_cdi_epo_espacenet_US2018286058A1</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>US2018286058A1</sourcerecordid><originalsourceid>FETCH-epo_espacenet_US2018286058A13</originalsourceid><addsrcrecordid>eNrjZJB1cQ1xDfL19PP0c1cIDg1yc3R2VQjyD3X38HMNDuZhYE1LzClO5YXS3AzKbq4hzh66qQX58anFBYnJqXmpJfGhwUYGhhZGFmYGphaOhsbEqQIALXMiRQ</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>patent</recordtype></control><display><type>patent</type><title>DETERMINING SURFACE ROUGHNESS</title><source>esp@cenet</source><creator>VADAKKE MATHAM, Murukeshan ; HARIDAS, Aswin ; CRIVOI, Alexandru ; PATINHAREKANDY, Prabhathan</creator><creatorcontrib>VADAKKE MATHAM, Murukeshan ; HARIDAS, Aswin ; CRIVOI, Alexandru ; PATINHAREKANDY, Prabhathan</creatorcontrib><description>A measurement system (301) for determining surface roughness is shown. A coherent illumination device (303) illuminates the surface of, for example, a component (201) with coherent light. An imaging device (304) obtains an image of speckle caused by the scattering of the coherent light from the surface. A processing device (305) converts the image into a binary image according to a threshold, thereby classifying pixels below the threshold as background pixels and pixels above the threshold as foreground pixels. One or more regions of connected foreground pixels are then identified in the binary image, in which any two foreground pixels in a region are joined by a continuous path of foreground pixels. The total number of regions identified and the number of pixels in the largest region are then evaluated, each of which correlate with surface roughness. An indication of the surface roughness of the surface is then outputted.</description><language>eng</language><subject>CALCULATING ; COMPUTING ; COUNTING ; IMAGE DATA PROCESSING OR GENERATION, IN GENERAL ; PHYSICS</subject><creationdate>2018</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&amp;date=20181004&amp;DB=EPODOC&amp;CC=US&amp;NR=2018286058A1$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,780,885,25562,76317</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&amp;date=20181004&amp;DB=EPODOC&amp;CC=US&amp;NR=2018286058A1$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>VADAKKE MATHAM, Murukeshan</creatorcontrib><creatorcontrib>HARIDAS, Aswin</creatorcontrib><creatorcontrib>CRIVOI, Alexandru</creatorcontrib><creatorcontrib>PATINHAREKANDY, Prabhathan</creatorcontrib><title>DETERMINING SURFACE ROUGHNESS</title><description>A measurement system (301) for determining surface roughness is shown. A coherent illumination device (303) illuminates the surface of, for example, a component (201) with coherent light. An imaging device (304) obtains an image of speckle caused by the scattering of the coherent light from the surface. A processing device (305) converts the image into a binary image according to a threshold, thereby classifying pixels below the threshold as background pixels and pixels above the threshold as foreground pixels. One or more regions of connected foreground pixels are then identified in the binary image, in which any two foreground pixels in a region are joined by a continuous path of foreground pixels. The total number of regions identified and the number of pixels in the largest region are then evaluated, each of which correlate with surface roughness. An indication of the surface roughness of the surface is then outputted.</description><subject>CALCULATING</subject><subject>COMPUTING</subject><subject>COUNTING</subject><subject>IMAGE DATA PROCESSING OR GENERATION, IN GENERAL</subject><subject>PHYSICS</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2018</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNrjZJB1cQ1xDfL19PP0c1cIDg1yc3R2VQjyD3X38HMNDuZhYE1LzClO5YXS3AzKbq4hzh66qQX58anFBYnJqXmpJfGhwUYGhhZGFmYGphaOhsbEqQIALXMiRQ</recordid><startdate>20181004</startdate><enddate>20181004</enddate><creator>VADAKKE MATHAM, Murukeshan</creator><creator>HARIDAS, Aswin</creator><creator>CRIVOI, Alexandru</creator><creator>PATINHAREKANDY, Prabhathan</creator><scope>EVB</scope></search><sort><creationdate>20181004</creationdate><title>DETERMINING SURFACE ROUGHNESS</title><author>VADAKKE MATHAM, Murukeshan ; HARIDAS, Aswin ; CRIVOI, Alexandru ; PATINHAREKANDY, Prabhathan</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_US2018286058A13</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>eng</language><creationdate>2018</creationdate><topic>CALCULATING</topic><topic>COMPUTING</topic><topic>COUNTING</topic><topic>IMAGE DATA PROCESSING OR GENERATION, IN GENERAL</topic><topic>PHYSICS</topic><toplevel>online_resources</toplevel><creatorcontrib>VADAKKE MATHAM, Murukeshan</creatorcontrib><creatorcontrib>HARIDAS, Aswin</creatorcontrib><creatorcontrib>CRIVOI, Alexandru</creatorcontrib><creatorcontrib>PATINHAREKANDY, Prabhathan</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>VADAKKE MATHAM, Murukeshan</au><au>HARIDAS, Aswin</au><au>CRIVOI, Alexandru</au><au>PATINHAREKANDY, Prabhathan</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>DETERMINING SURFACE ROUGHNESS</title><date>2018-10-04</date><risdate>2018</risdate><abstract>A measurement system (301) for determining surface roughness is shown. A coherent illumination device (303) illuminates the surface of, for example, a component (201) with coherent light. An imaging device (304) obtains an image of speckle caused by the scattering of the coherent light from the surface. A processing device (305) converts the image into a binary image according to a threshold, thereby classifying pixels below the threshold as background pixels and pixels above the threshold as foreground pixels. One or more regions of connected foreground pixels are then identified in the binary image, in which any two foreground pixels in a region are joined by a continuous path of foreground pixels. The total number of regions identified and the number of pixels in the largest region are then evaluated, each of which correlate with surface roughness. An indication of the surface roughness of the surface is then outputted.</abstract><oa>free_for_read</oa></addata></record>
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subjects CALCULATING
COMPUTING
COUNTING
IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
PHYSICS
title DETERMINING SURFACE ROUGHNESS
url https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-01-13T19%3A39%3A56IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-epo_EVB&rft_val_fmt=info:ofi/fmt:kev:mtx:patent&rft.genre=patent&rft.au=VADAKKE%20MATHAM,%20Murukeshan&rft.date=2018-10-04&rft_id=info:doi/&rft_dat=%3Cepo_EVB%3EUS2018286058A1%3C/epo_EVB%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_id=info:pmid/&rfr_iscdi=true