Method for Manufacturing a Semiconductor Device Comprising Etching a Semiconductor Material

According to embodiments, a method for manufacturing a semiconductor device includes forming a mask comprising a pattern of inert structures on a side of a first main surface of a semiconductor substrate. A semiconductor layer is formed over the first main surface, and the semiconductor substrate is...

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Bibliographische Detailangaben
Hauptverfasser: Muri, Ingo, Moder, Iris, Schulze, Hans-Joachim, Friedler, Sophia
Format: Patent
Sprache:eng
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Zusammenfassung:According to embodiments, a method for manufacturing a semiconductor device includes forming a mask comprising a pattern of inert structures on a side of a first main surface of a semiconductor substrate. A semiconductor layer is formed over the first main surface, and the semiconductor substrate is thinned from a second main surface opposite to the first main surface. Thereafter, a semiconductor region laterally adjoining the inert structures is anisotropically etched.