SEMICONDUCTOR STORAGE DEVICE

According to an embodiment, a semiconductor storage device includes a detection circuit configured to detect an error in data read from a first memory cell array. The read data of a size corresponding to a page unit is subjected to detection of an error for each of a plurality of first units into which the page unit is divided. When performing a first operation of concurrently executing outputting of first data read from the first memory cell array to an outside and reading of second data different from the first data from the first memory array, an interface circuit is configured to output information based on the error detected with respect to the first data to the outside.