SYSTEM AND METHOD FOR MEASUREMENT OF TEMPERATURE ON A GUIDED SURFACE WAVEGUIDE PROBE

Disclosed are various embodiments for providing temperature measurements of a guided surface wave probe and/or a support structure. In one embodiment, among others, a system comprises a guided surface waveguide probe configured to launch a guided surface wave along a lossy conducting medium, where t...

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Bibliographische Detailangaben
Hauptverfasser:	Pesavento, Philip V, Corum, James F, Salvitti, JR., James M, Corum, Kenneth L, Lomax, Jerry A
Format:	Patent
Sprache:	eng
Schlagworte:	ANTENNAS, i.e. RADIO AERIALS BASIC ELECTRIC ELEMENTS BASIC ELECTRONIC CIRCUITRY CIRCUIT ARRANGEMENTS OR SYSTEMS FOR SUPPLYING OR DISTRIBUTINGELECTRIC POWER CONVERSION OR DISTRIBUTION OF ELECTRIC POWER ELECTRICITY GENERATION IMPEDANCE NETWORKS, e.g. RESONANT CIRCUITS MEASURING MEASURING QUANTITY OF HEAT MEASURING TEMPERATURE PHYSICS RESONATORS RESONATORS, LINES, OR OTHER DEVICES OF THE WAVEGUIDE TYPE SYSTEMS FOR STORING ELECTRIC ENERGY TESTING THERMALLY-SENSITIVE ELEMENTS NOT OTHERWISE PROVIDED FOR WAVEGUIDES
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Beschreibung
Zusammenfassung:	Disclosed are various embodiments for providing temperature measurements of a guided surface wave probe and/or a support structure. In one embodiment, among others, a system comprises a guided surface waveguide probe configured to launch a guided surface wave along a lossy conducting medium, where the guided surface waveguide probe generates heat while in operation. The support structure comprises non-conducting structural components that support the electrical components of the guided surface waveguide probe. The system also comprises a temperature sensor positioned on one of the non-conducting structural components.