MANUFACTURING PROCESS DATA COLLECTION AND ANALYTICS

Techniques for comparing two or more sessions of a manufacturing process are described. In one example, a particular metric associated with execution of a manufacturing process is identified, the particular metric evaluated in a plurality of manufacturing process sessions for at least one manufactur...

Ausführliche Beschreibung

Gespeichert in:

Bibliographische Detailangaben
Hauptverfasser:	Cao, Ge, Meier, Stephan, Ganesh, Navdeep Raj, Weigold, Matthias, Noce, Robert, Raub, Philipp
Format:	Patent
Sprache:	eng
Schlagworte:	CONTROL OR REGULATING SYSTEMS IN GENERAL CONTROLLING FUNCTIONAL ELEMENTS OF SUCH SYSTEMS MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS ORELEMENTS PHYSICS REGULATING
Online-Zugang:	Volltext bestellen
Tags:	Tag hinzufügen Keine Tags, Fügen Sie den ersten Tag hinzu!

Beschreibung
Zusammenfassung:	Techniques for comparing two or more sessions of a manufacturing process are described. In one example, a particular metric associated with execution of a manufacturing process is identified, the particular metric evaluated in a plurality of manufacturing process sessions for at least one manufacturing process. A particular session particular session from the plurality of manufacturing process sessions is selected as a baseline session, wherein at least a portion of the remaining plurality of manufacturing process sessions are to be compared to the baseline session. In a primary portion of a presentation area, a visualization of the values of the identified metric associated with the particular session are presented. In a secondary portion of the presentation area, visualizations of the values of the identified metric associated with at least a portion of the other manufacturing process sessions from the plurality of sessions is presented.