STATISTICAL ANALYSIS IN X-RAY IMAGING

A method of analyzing a specimen using X-rays, comprising the steps of: irradiating the specimen with input X-rays; using a detector to detect a flux of output X-rays emanating from the specimen in response to said irradiation, which method further comprises the following steps: using the detector t...

Ausführliche Beschreibung

Gespeichert in:

Bibliographische Detailangaben
Hauptverfasser:	Fullagar, Wilfred Kelsham, Myers, Glenn Robert, Varslot, Trond Karsten, Kingston, Andrew Maurice, Paziresh, Mahsa
Format:	Patent
Sprache:	eng
Schlagworte:	GAMMA RAY OR X-RAY MICROSCOPES INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES IRRADIATION DEVICES MEASURING NUCLEAR ENGINEERING NUCLEAR PHYSICS PHYSICS TECHNIQUES FOR HANDLING PARTICLES OR IONISING RADIATION NOTOTHERWISE PROVIDED FOR TESTING
Online-Zugang:	Volltext bestellen
Tags:	Tag hinzufügen Keine Tags, Fügen Sie den ersten Tag hinzu!

Beschreibung
Zusammenfassung:	A method of analyzing a specimen using X-rays, comprising the steps of: irradiating the specimen with input X-rays; using a detector to detect a flux of output X-rays emanating from the specimen in response to said irradiation, which method further comprises the following steps: using the detector to intercept at least a portion of said flux so as to produce a set {Ij} of pixeled images Ij of at least part of the specimen, whereby the cardinality of the set {Ij} is M>1; for each pixel pi, in each image Ij, determining the accumulated signal strength Sij, thus producing an associated set of signal strenghs {Sij}; using the set {Sij} to calculate the following values: a mean signal strength S per pixel position i; a variance Sigma2S in S per pixel position i; and using these values S and Sigma2S to produce a map of mean X-ray photon energy E per pixel.