SHORTING BAR STRUCTURE AND METHOD FOR MANUFACTURING THE SAME AND THIN FILM TRANSISTOR SUBSTRATE

The present disclosure provides a shorting bar structure and a method for manufacturing the same, and a Thin Film Transistor (TFT) substrate. The shorting bar structure comprises: a test wire; a test probe contact part connected to the test wire and configured to be able to contact with a test probe...

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Bibliographische Detailangaben
Hauptverfasser: Wang, Yong, Seop, Cheong Yo, Joo, Jaeyoung, Xie, Zongtian, Yu, Yang, Tang, Cundui, Wu, Huailiang, Jiang, Zengyang, Guo, Hongyan
Format: Patent
Sprache:eng
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Beschreibung
Zusammenfassung:The present disclosure provides a shorting bar structure and a method for manufacturing the same, and a Thin Film Transistor (TFT) substrate. The shorting bar structure comprises: a test wire; a test probe contact part connected to the test wire and configured to be able to contact with a test probe; and at least one PN junction structure located between the test wire and at least one wire under test, and configured to allow a test signal to be unidirectionally transmittable in a direction from the test wire to the wire under test.