TEST AUTOMATION USING MULTIPLE PROGRAMMING LANGUAGES

A device may receive information identifying a first set of instructions. The first set of instructions may identify an action to perform to test a first program. The device may identify a second set of instructions, related to testing a second program, that can be used in association with the first...

Ausführliche Beschreibung

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Bibliographische Detailangaben
Hauptverfasser:	Basha Nure, Subani, Era, Dipin, Jayaraman, Bargav, Podder, Sanjay, Priyadarshi, Aditya, Dubash, Neville, DWARAKANATH, Anurag
Format:	Patent
Sprache:	eng
Schlagworte:	CALCULATING COMPUTING COUNTING ELECTRIC DIGITAL DATA PROCESSING PHYSICS
Online-Zugang:	Volltext bestellen
Tags:	Tag hinzufügen Keine Tags, Fügen Sie den ersten Tag hinzu!

Beschreibung
Zusammenfassung:	A device may receive information identifying a first set of instructions. The first set of instructions may identify an action to perform to test a first program. The device may identify a second set of instructions, related to testing a second program, that can be used in association with the first set of instructions. The first test may be similar to the second test. The device may identify multiple steps, of the first set of instructions, that can be combined to form a third set of instructions. The third set of instructions may be used to test the first program or a third program. The device may generate program code in a first programming language to perform the action. The first programming language may be different than a second programming language used to write the first set of instructions. The device may perform the action.