SECURITY INSPECTION APPARATUS AND METHOD

A security inspection apparatus and a security inspection method are disclosed. In one aspect, an example apparatus includes a CT inspection device and a Raman spectrum inspection device, the CT inspection device includes: a CT scanner scanning an object to be inspected to generate a CT image, an im...

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Bibliographische Detailangaben
Hauptverfasser:	YANG, Nei, WEI, Guohua, ZHANG, Jianhong, WANG, Hongqiu, YI, Yumin, TANG, Hu
Format:	Patent
Sprache:	eng
Schlagworte:	DETECTING MASSES OR OBJECTS GEOPHYSICS GRAVITATIONAL MEASUREMENTS INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES MEASURING PHYSICS TESTING
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Beschreibung
Zusammenfassung:	A security inspection apparatus and a security inspection method are disclosed. In one aspect, an example apparatus includes a CT inspection device and a Raman spectrum inspection device, the CT inspection device includes: a CT scanner scanning an object to be inspected to generate a CT image, an image recognizing device recognizing the CT image to check whether or not the object has a suspected hazardous article, and an object marking device making a predetermined marker on the object which has the suspected hazardous article. The Raman spectrum inspection device includes: a Raman spectrum measuring device extracting a Raman spectrum of the suspected hazardous article in the object, a Raman spectrum comparing device comparing the Raman spectrum of the suspected hazardous article with Raman spectra of known compositions to determine a composition of the suspected hazardous article, and an object marker recognizing device recognizing the predetermined marker on the object.