CONTACT DEVICE AND A METHOD OF TESTING A SINGULATED ELECTRONIC COMPONENT USING A CONTACT DEVICE

CONTACT DEVICE AND A METHOD OF TESTING A SINGULATED ELECTRONIC COMPONENT USING A CONTACT DEVICE

A contact device (200, 200′) and a method for testing a singulated electronic component (101). The contact device (200, 200′) comprises a plunger unit (202) comprising a chamber lid (220) and a nest (230) which is adapted to carry the singulated electronic component (101), and a socket unit (201) co...

Ausführliche Beschreibung

Gespeichert in:
Bibliographische Detailangaben
Hauptverfasser: Leikermoser, Volker, Petermann, Manuel, Ludwig, Andreas
Format: Patent
Sprache:eng
Schlagworte:
MEASURING
MEASURING ELECTRIC VARIABLES
MEASURING MAGNETIC VARIABLES
PHYSICS
TESTING
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Beschreibung
Zusammenfassung:A contact device (200, 200′) and a method for testing a singulated electronic component (101). The contact device (200, 200′) comprises a plunger unit (202) comprising a chamber lid (220) and a nest (230) which is adapted to carry the singulated electronic component (101), and a socket unit (201) comprising a socket (132) and a chamber (210) having an open front side and surrounding the socket (132). The chamber (210) is adapted in that closing of the chamber (210) at its open front side (219) by the chamber lid (220) comprises automatically contacting the singulated electronic component (101) to the socket (132).