SEMICONDUCTOR DEVICE MANUFACTURING METHOD

A first parallel pn layer in which first n-type regions and first p-type regions are disposed in a plan view layout of stripes in an element active portion. A second parallel pn layer has a plan view layout of stripes oriented in the same direction as that of the stripes of the first parallel pn lay...

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Bibliographische Detailangaben
Hauptverfasser: Sakata, Toshiaki, Takenoiri, Shunji, Niimura, Yasushi
Format: Patent
Sprache:eng
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Beschreibung
Zusammenfassung:A first parallel pn layer in which first n-type regions and first p-type regions are disposed in a plan view layout of stripes in an element active portion. A second parallel pn layer has a plan view layout of stripes oriented in the same direction as that of the stripes of the first parallel pn layer in a breakdown voltage structure portion. Corner portions of the first parallel pn layer has a plan view shape where stepped regions formed by shortening the length of the first n-type and p-type regions in steps are disposed in a stepwise arrangement. The stepped regions continue with a second parallel pn layer via an intermediate region lower in average impurity concentration than the first parallel pn layer.