Abnormality Detecting Apparatus

An abnormality detecting apparatus disclosed herein includes one or more sensors which measure a variety of conditions of a detecting object; a measurement data acquisition unit which acquires measurement data for prediction computation and measurement data for estimation computation from the sensor...

Ausführliche Beschreibung

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Bibliographische Detailangaben
1. Verfasser: MUTO, Kazuo
Format: Patent
Sprache:eng
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Beschreibung
Zusammenfassung:An abnormality detecting apparatus disclosed herein includes one or more sensors which measure a variety of conditions of a detecting object; a measurement data acquisition unit which acquires measurement data for prediction computation and measurement data for estimation computation from the sensors; a model database which stores a normal behavior model which represents behavior of the detecting object when the object runs normally and a plurality of abnormal behavior models which represent behavior of the detecting object when abnormality occurs therein due to one of various causes; normal behavior model prediction means for calculating predicted values for measurement data for estimation computation in a normal condition of the detecting object from measurement data for prediction computation and a normal behavior model; abnormal behavior model prediction means for calculating predicted values for measurement data for estimation computation in an abnormal condition of the detecting object due to one of various causes from measurement data for prediction computation and a plurality of abnormal behavior models; and abnormality cause estimation means for estimating presence or absence of abnormality of the detecting object and a cause of the abnormality, based on measurement data for estimation computation, predicted values by the normal behavior model prediction means, and predicted values by the abnormal behavior model prediction means.